Radiation-Induced Precipitation in Silicon During High-Voltage Electron Microscope Observation
- 1 August 1971
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 42 (9), 3559-3561
- https://doi.org/10.1063/1.1660770
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Electron displacement damage in copper and aluminium in a high voltage electron microscopePhilosophical Magazine, 1968
- An introduction to high-voltage electron microscopyJournal of Materials Science, 1968
- Electron microscopy at high voltagesPhilosophical Magazine, 1968