Alternative configuration for refracted near-field measurements of refractive index on glass-integrated-optics waveguides
- 20 November 1992
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 31 (33), 7108-7112
- https://doi.org/10.1364/ao.31.007108
Abstract
We present experimental investigations of two configurations for refractive-index profiling and for geometry measurements of glass-integrated waveguides with the refracted near-field technique. An original configuration is proposed that simplifies the measurement cell and the handling.This publication has 5 references indexed in Scilit:
- Correcting refracted near field refractive index profile measurements for gaussian intensity distributionsOptics Communications, 1991
- Silicon Mach-Zehnder waveguide interferometers operating at 1.3 μmElectronics Letters, 1991
- Refractive index profiling-state of the artJournal of Lightwave Technology, 1989
- Index profiling of three-dimensional optical waveguides by the propagation-mode near-field methodJournal of Lightwave Technology, 1986
- Practical application of the refracted near-field technique for the measurement of optical fibre refractive index profilesOptical and Quantum Electronics, 1979