Rankings
Publications
Search Publications
Cited-By Search
Sources
Publishers
Scholars
Scholars
Top Cited Scholars
Organizations
About
Login
Register
Home
Publications
Summary Abstract: High resolution electron microscopy of CaF2/silicon interfaces
Home
Publications
Summary Abstract: High resolution electron microscopy of CaF2/silicon interfaces
Summary Abstract: High resolution electron microscopy of CaF2/silicon interfaces
FP
F. A. Ponce
F. A. Ponce
GA
G. B. Anderson
G. B. Anderson
MO
M. A. O’keefe
M. A. O’keefe
LS
L. J. Schowalter
L. J. Schowalter
Publisher Website
Google Scholar
Add to Library
Cite
Download
Share
Download
1 July 1986
journal article
Published by
American Vacuum Society
in
Journal of Vacuum Science & Technology B
Vol. 4
(4)
,
1121-1122
https://doi.org/10.1116/1.583553
Abstract
No abstract available
Cited by 33 articles