The effect of subsurface topography on secondary electron images from chromate pretreated aluminium surfaces
- 1 December 1985
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 140 (3), 383-393
- https://doi.org/10.1111/j.1365-2818.1985.tb02691.x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Beam interactions, contrast and resolution in the SEMJournal of Microscopy, 1984
- Secondary electron emission in the scanning electron microscopeJournal of Applied Physics, 1983
- The Structures and Surface Composition of Chromate Conversion Coatings: An XPS and SEM StudyTransactions of the IMF, 1982
- XPS studies of a ferricyanide accelerated chromate paint pretreatment film on an aluminium surfaceSurface and Interface Analysis, 1981
- Specimen coating for high resolution scanning electron microscopyScanning, 1981