Spatially resolved photoluminescence characterization and optically induced degradation of In1−xGaxAsyP1−y DH laser material

Abstract
We have observed growth‐ and processing‐related defects and optically induced degradation in In1−xGaxAsyP1−y double‐heterostructure material intended for 1.2–1.3‐μm laser diodes. Threshold for the degradation observed decreases with increasing layer thickness, suggesting a relation to strain arising from compositional variation during growth.