Scanning tunneling microscopy topography of electron-beam evaporated niobium thin films in Nb–NbOx–Pb tunnel junctions on quartz substrates
- 1 March 1988
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 6 (2), 404-407
- https://doi.org/10.1116/1.575405