Abstract
Electromigration theories have brought increasing recognition that lattice inhomogeneities in metals produce spatial variations in current flow and in the associated transport field. It is shown, through a semiclassical one-dimensional model, that the spatial variations of carrier density near a lattice defect can produce strong local variations in the field required for current flow. This particular source of field inhomogeneity does not seem to have been recognized in earlier discussions.

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