Retroreflectance measurements of photometric standards and coatings
- 1 July 1976
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 15 (7), 1845-1849
- https://doi.org/10.1364/ao.15.001845
Abstract
Using a technique that we have developed, the opposition effect (brightening in the retroreflection direction) has been measured for MgCO3, BaSO4 paint, and sulfur in the visual region with incandescent illumination and found to be 1.3, 1.5, and 1.3, respectively, independent of wavelength. Nextel red, blue, white, and black paints are generally similar. However, in comparison to incoherent illumination, 0.6328-μm laser illumination shows a reduction in diffuse reflectance for angles less than 40° from the incident direction. In addition, the coherent opposition effect may be very large for dark paints. The opposition effect in photometric standards can lead to calibration errors at near opposition and spurious responses in integrating spheres coated with such materials.Keywords
This publication has 11 references indexed in Scilit:
- Integrating Spheres for Measurements Between 0185 μm and 12 μmApplied Optics, 1975
- Determination of Absorption and Scattering Coefficients for Nonhomogeneous Media 2: ExperimentApplied Optics, 1973
- Photometric studies of diffusely reflecting surfaces with applications to the brightness of the MoonJournal of Geophysical Research, 1966
- The radiance of lunar objects near oppositionPlanetary and Space Science, 1965
- Wavelength dependance of polarization. III. The lunar surface.The Astronomical Journal, 1964
- A theoretical photometric function for the lunar surfaceJournal of Geophysical Research, 1963
- Photometric studies of complex surfaces, with applications to the MoonJournal of Geophysical Research, 1963
- Les particularités dans la réflexion de la lumière par la surface de la LuneAstronomische Nachrichten, 1924
- Bestimmung der Erdalbedo und des Reflexionsgesetzes für die Oberfläche der Mondmeere. Theorie der Rillen.Astronomische Nachrichten, 1922
- The Measurement of Diffuse Reflection Factors and a New Absolute ReflectometerJournal of the Optical Society of America, 1920