Depth profiles of gold overlayers deposited onto 600‐Å silverfilms have been obtained with ion‐scattering spectrometry. The overlayers, 50, 200, 400, and 800 Å thick, were deposited at ∠10−4 Pa onto freshly deposited 600‐Å thick Agfilms. Complete coverage of the Ag underlayer was not achieved with the 50‐ and 200‐Å Au layers. Detectable signals (ϑ≡0.001) of Ag could still be obtained even with a 400‐Å Au overlayer. After aging for six to seven months at room temperature, the depth profiles show evidence for some bulk diffusion at the interface and a considerably enhanced accumulation of silvero v e r the gold. The latter is attributed to preferred diffusion paths for Ag ’’through’’ and/or on the Au overlayer; calculated values of the mean‐square displacement for the several diffusion paths are compared for the dimensions of the film. A sputtering yield of 2.0 Au atoms per Ne ion was calculated for 1800‐eV neon ions incident at 45° onto the Aufilms.