Spectroscopic ellipsometry of optical transitions in thin strained Si1−xGex films
- 31 May 1992
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 82 (6), 427-430
- https://doi.org/10.1016/0038-1098(92)90743-s
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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