Scanning-force-microscopy study of MeV-atomic-ion-induced surface tracks in organic crystals
- 1 January 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 49 (1), 625-628
- https://doi.org/10.1103/physrevb.49.625
Abstract
We present scanning force microscope images of craterlike defects induced by individual 78.2-MeV ions incident on organic single-crystal L-valine surfaces. For grazing incidence ions, the craters are elongated along the ion azimuth of incidence and display a raised tail in the surface above the ion track. This permanent plastic deformation of the surface indicates that a hydrodynamic pressure-pulse phenomenon occurs in response to the electronically deposited energy.
Keywords
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