Spatially-resolved X-ray Absorption Near-edge Spectroscopy of Silicon in Thin Silicon-oxide Films
- 1 January 1990
- journal article
- Published by IOP Publishing in Physica Scripta
- Vol. T31, 23-27
- https://doi.org/10.1088/0031-8949/1990/t31/003
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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