THE EFFECT OF CRYSTALLINITY AND BOMBARDMENT DOSE ON THE PENETRATION OF 40-keV XENON IONS IN IONIC CRYSTALS AND CERAMICS

Abstract

The range and depth distributions of 40-keV xenon ions in single crystals of NaCl, KBr, MgO, SiO₂ (α quartz), in sintered UO₂ and in fused silica, have been measured by the sectioning techniques of vibratory polishing and chemical dissolution. Channeling is observed in the single crystals when the [Formula: see text] is oriented parallel to the incident beam of the ions. This effect is similar to that previously reported for some metal single crystals. High bombardment doses produce a factor of 2–5 decrease in penetration depth in MgO and SiO₂, materials which are known to be damaged by ion bombardment. This decrease is smaller in materials that do not show gross ion bombardment damage, such as NaCl, KBr, and UO₂. Thus, the study of ranges is shown to be another means of detecting gross radiation damage.