Evolving Surface Cusps During Strained Layer Epitaxy
- 1 January 1993
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Evolution of surface morphology and strain during SiGe epitaxyThin Solid Films, 1992
- Anomalous strain relaxation in SiGe thin films and superlatticesPhysical Review Letters, 1991
- Dislocation-free Stranski-Krastanow growth of Ge on Si(100)Physical Review Letters, 1990
- High-resolution incoherent imaging of crystalsPhysical Review Letters, 1990
- On the stability of surfaces of stressed solidsActa Metallurgica, 1989
- Defects associated with the accommodation of misfit between crystalsJournal of Vacuum Science and Technology, 1975
- Theory of Thermal GroovingJournal of Applied Physics, 1957