Voltage readout of a temperature-controlled thin film thickness monitor
- 1 February 1977
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 10 (2), 161-163
- https://doi.org/10.1088/0022-3735/10/2/014
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A simple circuit of a crystal oscillator and its application to a high-resolution NMR spectrometerIEEE Transactions on Instrumentation and Measurement, 1976
- Digital single-sideband mixerProceedings of the IEEE, 1973
- Verwendung von Schwingquarzen zur W gung d nner Schichten und zur Mikrow gungThe European Physical Journal A, 1959