Some Observations of Imperfections in ADP Single Crystals by X-Ray Diffraction Micrography

Abstract

Lattice defects in ADP single crystals made by the Ogawa technique are studied using the Lang method of X-ray diffraction micrography. Besides dislocations, two kinds of lattice defects are observed; one is strain extended in band shape near the surfaces and the other interfaces. The interface which is not parallel to the surfaces of parallel-sided crystals generates parallel fringes in traverse photographs which consist of two systems of hook-shaped Pendellösung fringes inside the crystals.