Simple Mercury Drop Electrode for MOS Measurements
- 1 April 1967
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 38 (4), 564-565
- https://doi.org/10.1063/1.1720769
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- MOS CONDUCTANCE TECHNIQUE FOR MEASURING SURFACE STATE PARAMETERSApplied Physics Letters, 1965
- Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structuresSolid-State Electronics, 1965