A study of the migration loss in glass and a generalized method of calculating the rise of dielectric loss with temperature
- 1 January 1962
- journal article
- Published by Institution of Engineering and Technology (IET) in Proceedings of the IEE - Part B: Electronic and Communication Engineering
- Vol. 109 (22S), 440-447
- https://doi.org/10.1049/pi-b-2.1962.0077