The dielectric and interfacial characteristics of MIS structures on InP and GaAs
- 1 January 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 56 (1-2), 225-234
- https://doi.org/10.1016/0040-6090(79)90067-1
Abstract
No abstract availableThis publication has 30 references indexed in Scilit:
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