Electron-beam-induced current microcharacterization of fabrication defects in hydrogenated amorphous silicon solar cells
- 31 August 1984
- journal article
- Published by Elsevier in Solar Cells
- Vol. 12 (3), 329-335
- https://doi.org/10.1016/0379-6787(84)90111-x
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Charge collection scanning electron microscopyJournal of Applied Physics, 1982
- Defects in bombarded amorphous siliconPhilosophical Magazine Part B, 1979