Run length, average run length and false alarm rate of shewhart x-bar chart: exact derivations by conditioning
- 1 January 2000
- journal article
- research article
- Published by Taylor & Francis in Communications in Statistics - Simulation and Computation
- Vol. 29 (1), 61-81
- https://doi.org/10.1080/03610910008813602
Abstract
The effects of estimation of the control limits on the performance of the popular Shewhart X-bar chart are examined via the average run length and the probability of a false alarm, when one or both of the process mean and variance are unknown. Exact expressions for the run length, the average run length (ARL) and the false alarm rate are obtained, in each case, using expectation by conditioning. Applying Jensen's inequality, together with expectation by conditioning, a simple lower bound to the ARL is obtained. This could be useful in designing the charts. The expressions for the exact ARL and the exact probabilities of false alarm are evaluated, using simulations, for various numbers of subgroups and shift sizes. The calculations throw new light on the performance of the Shewhart X-bar chart. Some recommendations are given.Keywords
This publication has 5 references indexed in Scilit:
- Run length distributions and economic design of $$\bar X$$ charts with unknown process varianceMetrika, 1996
- An Improved Estimator of σ in Quality ControlProbability in the Engineering and Informational Sciences, 1995
- The Effect of Sample Size on Estimated Limits forX̄andXControl ChartsJournal of Quality Technology, 1993
- Large Sample Methods in StatisticsPublished by Springer Nature ,1993
- Shewhart x-charts with estimated process varianceCommunications in Statistics - Theory and Methods, 1981