Film growth characterization of an underlayer for perpendicular magnetic recording
- 1 September 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 20 (5), 779-781
- https://doi.org/10.1109/tmag.1984.1063378
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The magnetoresistivity, structure, and magnetic anisotropy of RF sputtered and E-beam evaporated NiFe filmsJournal of Applied Physics, 1981
- Radio-frequency sputtered NiFe films on AuJournal of Vacuum Science and Technology, 1980
- Perpendicular magnetic recording with a composite anisotropy filmIEEE Transactions on Magnetics, 1979
- Sputtered thin magnetic filmsIEEE Transactions on Magnetics, 1966
- Preferred Orientation and Ordering in Evaporated Films of Fe, Ni, and Fe-NiJournal of Applied Physics, 1960
- Texture of Evaporated NiFe Thin FilmsJournal of Applied Physics, 1959