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XPS Study of Annealed SiO2 / GaAs Interfaces
Home
Publications
XPS Study of Annealed SiO2 / GaAs Interfaces
XPS Study of Annealed SiO2 / GaAs Interfaces
UK
U. König
U. König
ES
E. Sasse
E. Sasse
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1 April 1983
journal article
Published by
The Electrochemical Society
in
Journal of the Electrochemical Society
Vol. 130
(4)
,
950-952
https://doi.org/10.1149/1.2119864
Abstract
No abstract available
Cited by 31 articles