Generalized ellipsometry based on azimuth measurements alone
- 1 April 1978
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 68 (4), 514-518
- https://doi.org/10.1364/josa.68.000514
Abstract
We investigate the azimuth response function, θo = f(θi), of a linear nondepolarizing optical system S, whereθi and θo, are the azimuths (orientations) of the generally elliptic vibrations of totally polarized light at the input and output of S. We find that the azimuth response function depends on five of the six parameters that specify the normalized circular Jones matrix of the optical system. Thus the entire polarization response of an optical system can be nearly completely reconstructed from its azimuth response alone. Five input-output azimuth measurements (θik, θok), k = 1, 2, ..., 5 are sufficient to fix the ARF. The procedure for such determination is considerably facilitated if the average of θo, when θi sweeps a full rang of π, is measured. The general design and automation of an instrument for performing azimuth measurements are discussed and the use of such measurements to determine the optical parameters of elliptic retarders is given as an application.Keywords
This publication has 6 references indexed in Scilit:
- New experimental methods for determining the optical parameters of elliptic retardersJournal of Physics D: Applied Physics, 1977
- Methods for determining the optical parameters of elliptic retarders*Journal of the Optical Society of America, 1975
- Application of generalized ellipsometry to anisotropic crystals*Journal of the Optical Society of America, 1974
- A new ellipsometer its principle, realization and performancesNouvelle Revue d'Optique, 1973
- New Ellipsometric Method for the Determination of the Optical Constants of Thin Films and SurfacesJournal of the Optical Society of America, 1972
- A New Calculus for the Treatment of Optical Systems VII Properties of the N-MatricesJournal of the Optical Society of America, 1948