Two-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields
- 1 August 1992
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 31 (22), 4519-4521
- https://doi.org/10.1364/ao.31.004519
Abstract
Ambiguity in the conversion of phase measurements to deformation values restricts the applicability of electronic speckle-pattern interferometry. The use of two wavelengths greatly relaxes this restriction.This publication has 1 reference indexed in Scilit:
- Electronic speckle pattern interferometry system for in situ deformation monitoring on buildingsOptical Engineering, 1990