Focused Intense Ion Beams Using Self-Pinched Relativistic Electron Beams
- 29 December 1975
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 35 (26), 1806-1808
- https://doi.org/10.1103/physrevlett.35.1806
Abstract
A new two-dimensional diode simulation code is used to show the possibility of using hemispherical diodes to produce converging ion beams in the 1-10-MA range. The pinched electron flow enhances ion emission, while suppressing electron emission, allowing . Such focused ion beams are of considerable interest for use in ablatively driven implosions of fusion targets.
Keywords
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