Discussion on the limitations of “in situ” deformation experiments in a high voltage electron microscope
- 31 December 1978
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 3 (2), 215-226
- https://doi.org/10.1016/s0304-3991(78)80028-x
Abstract
No abstract availableKeywords
This publication has 41 references indexed in Scilit:
- Distributions of point defects in bounded media under irradiationJournal of Nuclear Materials, 1976
- Influence de la température sur la pénétration des électrons dans les cristaux d'or observés en microscopie électronique sous 100 et 1000 kVPhilosophical Magazine, 1976
- Direct observation of cell formation in niobium by a high-voltage electron microscopePhysica Status Solidi (a), 1976
- The optimum voltage in very high voltage electron microscopyPhilosophical Magazine, 1972
- Maximizing the penetration in high voltage electron microscopyPhilosophical Magazine, 1971
- Temperaturabhängigkeit der Transparenz dünner Schichten für schnelle ElektronenThe European Physical Journal A, 1964
- Threshold Displacement Energies and Subthreshold Displacements in Copper and Gold Near 10°KJournal of Applied Physics, 1964
- Energy Dependence of Extinction Distance and Transmissive Power for Electron Waves in CrystalsJournal of Applied Physics, 1964
- Effect of Inelastic Waves on Electron DiffractionJournal of the Physics Society Japan, 1957
- The Coulomb Scattering of Relativistic Electrons by NucleiPhysical Review B, 1948