A simple method of automatic LEED spot tracing
- 2 July 1979
- journal article
- Published by Elsevier in Surface Science
- Vol. 86, 587-590
- https://doi.org/10.1016/0039-6028(79)90438-2
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Use of a Vidicon camera for the measurement of LEED beam intensities by the photographic methodJournal of Vacuum Science and Technology, 1976
- Fast LEED-intensity measurements with a computer controlled television systemApplied Physics A, 1976
- Determination of the escape length of low energy electrons by Auger and loss spectroscopyThin Solid Films, 1976
- New rapid and accurate method to measure low-energy-electron-diffraction beam intensities: The intensities from the clean Pt (111) crystal facePhysical Review B, 1975
- Pulsed-Beam Low Energy Electron Diffraction System for Rapid Precision MeasurementsReview of Scientific Instruments, 1964