Comparison of plated Co-P and sputtered Co-Re as recording media based on nucleation, growth, structure, and magnetics
- 15 April 1985
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 57 (8), 4028-4030
- https://doi.org/10.1063/1.334660
Abstract
The nucleation, growth, and microstructure of electroless plated Co-P and sputtered Co-Re have been studied and compared to their magnetics. Co-P starts to nucleate as islands with low nucleation density and high coercivity. The film becomes continuous at a thickness of 300 Å and has a rough surface. Co-Re, on the other hand, forms solid solutions and shows initial growth of high nucleation density and low coercivity. The superparamagneticlike range of Co-P is narrower than Co-Re. The impact of growth mechanism on the signal to noise ratio is analyzed and some recording performance data is presented.Keywords
This publication has 7 references indexed in Scilit:
- A comparison of the uniaxial anisotropy in sputtered Co–Re and Co–Cr perpendicular recording mediaJournal of Applied Physics, 1983
- Noise characteristics in plated Co-Ni-P film for high density recording mediumJournal of Applied Physics, 1982
- High coercivity and high hysteresis loop squareness of sputtered Co-Re thin filmJournal of Applied Physics, 1979
- Microstructure and magnetic properties of electroless Co-P thin films grown on an aluminum base disk substrateJournal of Applied Physics, 1978
- Analysis of Saturation Magnetic Recording Based on Arctangent Magnetization TransitionsJournal of Applied Physics, 1970
- Some Properties of Electroless CobaltJournal of the Electrochemical Society, 1968
- A correlation between magnetic properties and recording behavior in metallic chemically deposited surfacesIEEE Transactions on Magnetics, 1965