Fabrication and gain measurements for buried facet optical amplifier

Abstract
The paper reports the fabrication and gain measurements of buried facet optical amplifiers. Chip gain of 25 dB, gain ripple of < 1 dB and gain difference of < 1 dB for TE and TMpolarised light are observed. The gain is found to decrease rapidly with increasing temperature. This behaviour is explained using a model calculation of the radiative and nonradiative recombination rates in the active region of the amplifier.