Angle resolved photoelectron study of resonances near the Si 2p edge of the Si(CH3)4 molecule

Abstract

Photoelectron spectra of tetramethylsilane, were measured at selected photon energies in the vicinity of the Si 2p edge, using synchrotron radiation. In addition to known valence and core Si 2p bands, three LVV Auger lines (69, 76, and 80 eV electron energy) were observed for the first time. Partial and differential cross sections for the Si 2p band and two of the Auger lines have been measured at several photon energies from the Si 2p onset up to 135 eV. An intense resonance is evident in the Si 2p continuum as well as in the LVV Auger decay channels. Its position, right above threshold, accounts for only a part of the absorption feature. Another maximum, already seen in absorption around 124 eV, may be a shape resonance associated with the Si 2p continuum.