Current-Voltage Characteristics of Dielectric Films

Abstract

The current‐voltage characteristic of insulating films is usually regarded as being due to quantum‐mechanical tunneling for very thin films, and as being space‐charge‐limited for thicker films. Using an electronic model of a dielectric which was first introduced to explain dielectric breakdown, the current‐voltage characteristic is derived taking explicit account of field emission from the cathode and space‐charge buildup in the body of the dielectric. The characteristic is non‐Ohmic and dependent on thickness and temperature.