Interferometric measurement of electron-hole pair recombination lifetime as a function of the injection level
- 1 October 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 14 (10), 487-489
- https://doi.org/10.1109/55.244739
Abstract
The authors describe an interferometric technique for the measurement of the recombination lifetime of electron-hole pairs as a function of their concentration, which can be measured with an error smaller than 10%. In addition, the approach is much more sensitive than the other optical methods described in the literature.Keywords
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