Ion-beam-induced charge-collection imaging of CMOS ICs
- 1 June 1993
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 79 (1-4), 436-442
- https://doi.org/10.1016/0168-583x(93)95382-f
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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