Difference Auger spectroscopy for studying small quantities of elements on metallic surfaces
- 1 November 1973
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 44 (11), 1643-1645
- https://doi.org/10.1063/1.1686020
Abstract
Increased sensitivity in the detection of small amounts of impurities has been demonstrated by using a difference technique in Auger electron spectroscopy. The primary electron beam is switched at a frequency of 30 Hz between two points or two samples of interest. The signals from the two samples are subtracted electronically so that the final output is the difference of the Auger spectra from the two samples and is therefore sensitive to small differences in composition between the samples.Keywords
This publication has 1 reference indexed in Scilit:
- Determination of Surface Structures using LEED and Energy Analysis of Scattered ElectronsJournal of Applied Physics, 1969