Electron radiation damage in a high voltage electron microscope
- 1 November 1969
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 20 (167), 937-941
- https://doi.org/10.1080/14786436908228062
Abstract
The factors affecting the nucleation and growth of electron displacement damage in copper are investigated in a high voltage electron microscope. Under certain conditions large faulted loops (∼lμ) can be obtained. The contrast of the fault fringes enables them to be identified as interstitial in character. The first observation of the unfaulting reaction for extrinsic loops is reported.Keywords
This publication has 3 references indexed in Scilit:
- Electron displacement damage in copper and aluminium in a high voltage electron microscopePhilosophical Magazine, 1968
- The movement of dislocations during the observation of metal films inside an electron microscopePhilosophical Magazine, 1962
- Anomalous electron absorption effects in metal foilsPhilosophical Magazine, 1960