Optical charge-sensing method for testing and characterizing thin-film transistor arrays
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Selected Topics in Quantum Electronics
- Vol. 1 (4), 993-1001
- https://doi.org/10.1109/2944.488397
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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