Properties of organic specimens and their supports at 4 K under irradiation in an electron microscope
- 31 December 1982
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 10 (1-2), 71-86
- https://doi.org/10.1016/0304-3991(82)90189-9
Abstract
No abstract availableKeywords
This publication has 33 references indexed in Scilit:
- Beam damage to organic material is considerably reduced in cryo-electron microscopyJournal of Molecular Biology, 1980
- Reduction of radiation damage in an electron microscope with a superconducting lens systemNature, 1979
- Carbon loss during irradiation of T4 bacteriophages and E. coli bacteria in electron microscopesJournal of Ultrastructure Research, 1975
- Molecular structure determination by electron microscopy of unstained crystalline specimensJournal of Molecular Biology, 1975
- Structure of Wet Specimens in Electron MicroscopyScience, 1974
- Crystallite Features of Valonia cellulose by Electron Diffraction and Dark‐Field Electron MicroscopyBiopolymers, 1972
- Electron microscopy of tobacco mosaic virus under conditions of minimal beam exposureJournal of Molecular Biology, 1970
- Specimen damage caused by the beam of the transmission electron microscope, a correlative reconsiderationJournal of Ultrastructure Research, 1970
- The thermal conductivities of some dielectric solids at low temperatures (Experimental)Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1951
- Auflösungsbegrenzung im Elektronenmikroskop durch ObjektänderungThe European Physical Journal A, 1950