Probe-type thin-film head for perpendicular recording using multilayered Fe-Si-Ru films

Abstract
The coercivity dependence of read/write and noise characteristics are investigated for the probe‐type thin‐film head using multilayered Fe‐Si‐Ru films and Co‐Cr/Co‐Zr‐Mo double‐layer media. The D50 recording density of 100 kFCI (flux change per inch) and the output of 0.24 μVpp/μm turn m/s are obtained for the medium with the coercivity of 500 Oe. These characteristics are superior to those for conventional ring head (D50=80 kFCI, E1k=0.12 μVpp/μm turn m/s). Further, thin‐film heads have low noise and high overwrite characteristics.