VLSI will be reaching to the limit of minimization in the 1990s, and after that, further increase of packing density or functions might depend on the vertical integration technology. Three-dimensional (3-D) integration is expected to provide several advantages, such as 1) parallel processing, 2) high-speed operation, 3) high packing density, and 4) multifunctional operation. Basic technologies of 3-D IC are to fabricate SOI layers and to stack them monolithically. Crystallinity of the recrystallized layer in SOI has increasingly become better, and very recently crystalaxis controlled, defect-free single-crystal area has been obtained in chip size level by laser recystallization technology. Some basic functional medels showing the concept or image of a future 3-D IC were fabricated in two or three stacked active layers. Some other proposals of subsystems in the application of 3-D structure, and the technical issues for realizing practical 3-D IC, i.e., the technology for fabricating high-quality SOI crystal on complicated surface topology, crosstalk of the signals between the stacked layers, total power consumption and cooling of the chip, will also be discussed in this paper.