Fault tolerant 92160 bit multiphase CCD memory

Publisher Website

1 January 1977

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 116-117
https://doi.org/10.1109/isscc.1977.1155685

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

4096-bit serial decoded multiphase serial-parallel-serial CCD memory
IEEE Journal of Solid-State Circuits, 1976
A 16384-bit high-density CCD memory
IEEE Journal of Solid-State Circuits, 1976

Cited by 11 articles