A semi-empirical model for the tunnel current-voltage characteristics in Al-SiO2-Si(p) structures
- 29 February 1996
- journal article
- review article
- Published by Elsevier in Solid-State Electronics
- Vol. 39 (2), 251-260
- https://doi.org/10.1016/0038-1101(95)00119-0
Abstract
No abstract availableKeywords
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