Refractive indices of zinc sulfide and cryolite in multilayer stacks
- 1 August 1976
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 15 (8), 1969-1973
- https://doi.org/10.1364/ao.15.001969
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.This publication has 10 references indexed in Scilit:
- Large-area uniform evaporated thin filmsVacuum, 1974
- Properties of ZnS Films Evaporated in High VacuumJapanese Journal of Applied Physics, 1974
- Correlation between film structure and sorption behaviour of vapour deposited ZnS, cryolite and MgF2 filmsThin Solid Films, 1972
- Composition and structure of vapour-deposited cryolite filmsThin Solid Films, 1970
- Fabrication of Multilayer Dielectric FilmsJournal of Vacuum Science and Technology, 1966
- Instrument for the Absolute Measurement of Direct Spectral Reflectances at Normal IncidenceJournal of the Optical Society of America, 1964
- Détermination de la structure de couches minces transparentes par des méthodes optiques ; étude théorique de leur formationAnnales de Physique, 1962
- Optische Untersuchungen des Aufbaus von Kryolith-AufdampfschichtenThe European Physical Journal A, 1961
- Etude des Propriétés Optiques des Couches Minces Transparentes en Liaison avec leur StructureOptica Acta: International Journal of Optics, 1956
- Contribution à l'étude de l'intensité des raies et bandes d'absorption dans l'infrarougeJournal de Physique et le Radium, 1952