Pattern Classification with Compact Distribution Maps
- 1 April 1998
- journal article
- Published by Elsevier in Computer Vision and Image Understanding
- Vol. 70 (1), 101-110
- https://doi.org/10.1006/cviu.1998.0624
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- An overtraining-resistant stochastic modeling method for pattern recognitionThe Annals of Statistics, 1996
- Document Image Defect ModelsPublished by Springer Nature ,1992
- Stochastic discriminationAnnals of Mathematics and Artificial Intelligence, 1990
- Fundamentals of Electronic Imaging SystemsSpringer Series in Information Sciences, 1986
- Research on Machine Recognition of Handprinted CharactersIEEE Transactions on Pattern Analysis and Machine Intelligence, 1984
- A Projection Pursuit Algorithm for Exploratory Data AnalysisIEEE Transactions on Computers, 1974