Roughening and Lower Critical Dimension in the Random-Field Ising Model
- 30 August 1982
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 49 (9), 685-688
- https://doi.org/10.1103/physrevlett.49.685
Abstract
It is argued on the basis of a new interface model that the lower critical dimension of random-field Ising systems is two, in agreement with simple domain estimates.Keywords
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