Continuous Plasma Density Measurements from Spectral Line Profiles
- 1 October 1968
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 39 (10), 1575-1576
- https://doi.org/10.1063/1.1683166
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Eight-Channel Polychromator to Measure Narrow Transient Spectral Profiles in the UltravioletApplied Optics, 1966
- Nine-Channel Polychromator for Observation of Time-Dependent Spectral Line ProfilesApplied Optics, 1963
- Optical Emission Line Profile AnalyzerReview of Scientific Instruments, 1962