Study of transferred populations between Kr and Xe atoms by profile analysis
- 31 July 1978
- journal article
- Published by Elsevier in Optics Communications
- Vol. 26 (1), 50-53
- https://doi.org/10.1016/0030-4018(78)90339-5
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Influence of excitation transfers on anomalous profiles observed in the 3.36μm line of xenonJournal of Physics B: Atomic and Molecular Physics, 1975
- Analysis of line-profiles by use of a monomode laserJournal of Physics B: Atomic and Molecular Physics, 1974
- Hanle effect of 2p3, 2p6, 2p7, 2p8, 2p9 and 3p8 levels of Xe IOptics Communications, 1972
- Radiative Lifetimes and Collisional Cross Sections for Xe i and iiJournal of the Optical Society of America, 1969