Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS) as a New Tool for Solid Surface Characterization

Publisher Website

1 January 1980

journal article
Published by Japan Academy in Proceedings of the Japan Academy, Series B

Vol. 56 (10), 654-659
https://doi.org/10.2183/pjab.56.654

Abstract

No abstract available

Keywords

X RAY PHOTOELECTRON SPECTROSCOPY

Cited by 3 articles