Flux Flow in Thin Type-I Superconducting Films

Abstract
Using dc and pulsed currents of 80-nsec duration, the flux-flow resistance has been observed at temperatures T0.9Tc in flat films of tin of thickness 440 to 1580 Å in a perpendicular magnetic field H. At low values of H, the reduced flow resistivity ρfρn is given by ρfρn=0.76[HHc(T)]32, which is in agreement with published data on bulk type-II superconductors. Flux flow is absent at temperatures T0.9Tc, and highly nonlinear for a film of 3420 Å thickness. The flux flow starts at a current density Jp where the flux tubes break free from their pinning centers. The dependence of Jp on magnetic field and temperature has been investigated both experimentally and theoretically. As the sample current is increased, an instability is observed at a current density JI, at which the resistance increases sharply. The dependence of JI on magnetic field, temperature, and film thickness has been determined. Close to Tc, the instability current JI is almost independent of thickness and is given by JI=3.0×106[1(TTc)2][0.9HHc(T)] A/cm2. An investigation of the time dependence of the sample voltage indicates the existence of a time constant t which, near Tc, decreases exponentially with current density. JI is then defined as the current density at which t becomes shorter than the time of observation.