Calibrating a Dual Six-Port or Four-Port for Measuring Two-Ports with Any Connectors
- 23 March 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 86 (0149645X), 665-668
- https://doi.org/10.1109/mwsym.1986.1132276
Abstract
A technique is described for calibrating a dual six-port & four-port ANA so that the scattering parameters of two-port devices having any combination of connectors can be measured. The technique is a generalization of the "thru-reflect-line" (TRL) calibration technique in which the "thru" is replaced with a second length of precision transmission line.Keywords
This publication has 2 references indexed in Scilit:
- Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network AnalyzerIEEE Transactions on Microwave Theory and Techniques, 1979
- Recession depth in metallic conductors at low frequenciesElectronics Letters, 1971